Introduction to the TCi: Explaining the Modified Transient Plane Source Technique

Learn about the basics of operation to the C-Therm TCi Thermal Conductivity Analyzer. This webinar provides an excellent introduction in understanding the capabilities and limitations of the modified transient plane source (MTPS) method for thermal conductivity characterization.  The TCi offers rapid, non-destructive thermal conductivity testing capability. Designed for lab, quality control and production environments, the TCi is factory calibrated and provides users broad testing ranges - from 0.03 to 100 W/mK at temperatures from (-50º C) to (200º C). The C-Therm TCi provides accurate thermal analysis of solids, liquids, powders and pastes in less time than any other instrument commercially available. Samples require little to no preparation.  The webinar is principally focused on outlining the basic principles of operation to the technique - but will also highlight applications in the fields of nanomaterials, energetics/explosives, concrete/asphalt, metal hydrides, and polymers.

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